Webinar
Advanced Motion Control for Semiconductor Metrology
Tuesday, May 13, 2025
11:00 AM EST
Are you facing the ever-increasing demands for accuracy, speed and reliability for your semiconductor inspection and metrology tools? This webinar provides a comprehensive overview of advanced motion control fundamentals and key technologies specifically tailored to address this industry’s unique challenges.
Join us to learn valuable insights, including:
- How precision motion systems enable cutting-edge applications like wafer inspection, scanning white light interferometry (SWLI), electron/ion beam microscopy (SEM/FIB), atomic force microscopy (AFM) and reticle/mask inspection;
- How on-axis and off-axis error motions affect metrology applications, plus techniques for compensating for those errors;
- How system-level optimization, consideration of environmental factors and the application of advanced controls techniques are crucial for achieving nanometer-level precision and maximizing throughput;
- How industry-leading solutions are pushing the boundaries of what’s possible in semiconductor metrology.
Justin Bressi is Aerotech’s business development manager for the semiconductor and photonics industries. He has 10+ years of experience in precision motion systems and robotics, holding roles in applications engineering, field sales and business development. Justin earned his bachelor's degree in mechanical engineering and his master’s degree in business administration from the University of Pittsburgh.